(Scanning) Transmission Electron Microscope (TEM/STEM) TitanTM G2 60-300 with imaging Cs-corrector is an advanced tool for structural characterization of materials at sub-Angstrom resolution. Possessing a broad variety of complementary features, including X-FEG, monochromator, high-resolution Quantum GIF, EDX detector, electron bi-prism and Lorenz lens, this instrument allows to access structure, electronic and magnetic properties, as well as chemical compositions of nano-materials and nano-devices.
Helios NanoLabTM DualBeamTM instrument combines high resolution imaging capabilities of an advanced SEM with the full set of tools for nano-structuring and nano-manipulation. A high-resolution Focused Ion Beam (FIB) column, advanced gas chemistry and a high precision mechanics of the instrument facilitate a new level in nano-device fabrication and characterization. The FIB tool will help to explore new processes for the fabrication of functional nanostructures and nanodevices, complementary to other techniques such as Photo- and Electron-Beam Lithography also available at nanoGUNE.
Environmental Scanning Electron Microscope (ESEM) QuantaTM 250 FEG provides access to studies of wet biological samples, nano-bio composites and nano-fluidic phenomena. Studies of real-time redox chemistry involving nano-objects and the imaging of fluids under microfluidic conditions are some of the topics, in which the ESEM is playing a key role.
Tripod polishing, classical ion milling and ultrasonic processing are available in the lab for material science samples preparation