Electron Microscopy Lab.

28/01/2010

Aiming for establishing a world level expertise in characterization of nanoscale materials and processes, CIC nanoGUNE has recently purchased a family of high-end electron microscopes including ESEM, SEM, FIB and TEM/STEM tools from FEI Company (Netherlands)

Environmental Scanning Electron Microscope (ESEM) Quanta 250 FEG will provide an access to studies of wet biological samples, nano-bio composited and nano-fluidic phenomena.

Dual beam Helios NanoLab combines high resolution imaging capabilities of advanced SEM with the full set of tools for nano-structuring and nano-manipulation. High resolution Focused Ion Beam (FIB) column, advanced gas chemistry and sub-nanometer precise mechanics of the instrument will promote establishing of a new level in nanodevice fabrication and characterization.

(Scanning) Transmission Electron Microscope (TEM/STEM) Titan G2 60-300 with imaging Cs-corrector is an advanced tool for structural characterization of materials at deep sub-Angstrom resolution. Possessing a broad variety of complement features, including X-FEG, monochromator, high-resolution Quantum GIF, EDX detector, electron bi-prism and Lorenz lens, this unique instrument will to access electronic, magnetic properties and chemical composition of nanomaterials and nanodevices.