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Facilities

Our state-of-the-art facility consists of:

• (Scanning) Transmission Electron Microscope (TEM/STEM) with an imaging Cs-corrector.

• DualBeamTM (FIB/SEM) nanofabrication tool

• Environmental Scanning Electron Microscope (ESEM)

• Broad range of material-science samples-preparation lines. 

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