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X-ray reflectivity/diffractometry (X'pert PRO by PANalytical)

X-ray reflectivity/diffractometry (X'pert PRO by PANalytical)

X-ray reflectivity photograph

X-ray diffraction for enabling wide-ranging structural characterizations such as layer crystallinity, grain size analysis, epitaxial relations, layer thickness and interface intermixing, allowing for the optimization of sample preparation conditions and layering sequences.

Offered as External Service
Related Sectors: 
Automotive industry
Glass coatings
Laboratory test facility
Material science industry
Microelectronics and semiconductor industry
Microscopy laboratories
Photovoltaic
Semiconductors
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