Focused on near-field optics, optoelectronics, plasmonics, the development of microscopic optical equipment, and the development of nanodevices and their effect on nanophotonics.

The group develops near-field optical microscopy providing nanoscale spatial resolution independent of the wavelength. It is based on atomic force microscopy (AFM) where a sharp scanning tip is used for mechanical probing and for scattering optical near-fields (scattering-type Scanning Near-field Optical Microscopy, s-SNOM). Operating at infrared and terahertz frequencies, the s-SNOM allows nondestructive analysis of the local chemical composition, structural properties properties and local conductivity with potential applications ranging from characterization of nanoelectronic devices to identification of single nanoparticles and macromolecules. The microscope is also applied to study the near-field distribution of novel photonic devices such as optical and infrared antennas.

Group Leader: Rainer Hillenbrand
Email: r.hillenbrand@nanogune.eu