Proiektuak

  • SPM2.0- Scanning probe microscopies for nanoscale fast, tomographic and composition imaging

    Advanced Microscopy are widely recognized as one of the pillars onto which the research and manufacture of Nanotechnology based products is sustained. At present, the greatest challenge faced by these techniques is the realization of fast and non-destructive tomographic images with chemical composition sensitivity and with sub-10 nm spatial resolution, in both organic and inorganic materials, and in all environmental conditions.