Revista - Microscopy And Microanalysis

1. L. I. Fedina, S. A. Song, A. Chuvilin, A. K. Gutakovskii and A. V. Latyshev
Microscopy And Microanalysis 19, 38 (2013)
The Mechanism of {113 Defect Formation in Silicon: Clustering of Interstitial-Vacancy Pairs Studied by In Situ High-Resolution Electron Microscope Irradiation

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