Electron-microscopy - Revista - ACS Photonics
1. S. Mastel, A. Goyyadinov, C. Maisseni, A. Chuvilin, A. Berger and R. Hillenbrand
ACS Photonics 5, 3372 (2018)
Understanding the Image Contrast of Material Boundaries in IR Nanoscopy Reaching 5 nm Spatial Resolution
This document is the Accepted Manuscript version of a Published Work that appeared in final form in ACS Photonics copyright © American Chemical Society after peer review and technical editing by the publisher.
2. P. Sarriugarte, M. Schnell, A. Chuvilin and R. Hillenbrand
ACS Photonics 1, 604 (2014)
Polarization-Resolved Near-Field Characterization of Nanoscale Infrared Modes in Transmission Lines Fabricated by Gallium and Helium Ion Beam Milling