STM/AFM (4 K) in UHV with light detection set-up

STM/AFM photograph

Ultra-Low-Temperature (4.8 K) Ultra-High-Vacuum Scanning Tunneling and Atomic Force Microscope (STM-AFM). It has a light emission spectroscopy set-up. It is used for molecular optoelectronics, light-emission in tunneling microscopy studies, and measurements of forces and interactions at the atomic scale.

Research group
Technical characteristics
  • Scanning tunneling microscope (STM)
  • Non-contact atomic force microscope (nc-AFM)
  • Ultra-High Vacuum
  • Light spectroscopy
  • Base temperature 4.8 K