STM/AFM (4 K) in UHV with light detection set-up

Low-Temperature (4.8 K) Ultra-High-Vacuum Scanning Tunneling and Atomic Force Microscope (STM-AFM). It has a light emission spectroscopy setup. It is used for molecular optoelectronics, light-emission in tunneling microscopy studies, and measurements of forces and interactions at the atomic scale.
Research group
Technical characteristics
- Scanning tunneling microscope (STM)
- Non-contact atomic force microscope (nc-AFM)
- Ultra-High Vacuum
- Light spectroscopy
- Base temperature 4.8 K