Spectroscopic ellipsometer (GES5 spectroscopic-ellipsometer SEMILAB)

Spectroscopic ellipsometer (GES5 spectroscopic-ellipsometer SEMILAB)
Offered as External Service

What we can offer:

  • Non-destructive measurement of a wide range of layer thicknesses and material optical properties.


  • To measure optical properties at wavelengths from 230 to 900 nm.

  • To measure at different incidence angles (from 40° to 77°).

  • To perform automatic multipoint measurements using a xy sample stage movement.

  • To perform spectroscopic photometry measurements (transmittance and reflectance).

  • To extract valuable optical information by automatic comparison, using a specialized software, of the measured data to the reference data available at big data-bases.

Interesting for (with the system):

  • Material science industry, optoelectronic and optical industry, photovoltaic, semiconductors…


The nanoGUNE cleanroom, dedicated to fabricate and characterize the properties of materials on the nanoscale, ia a 300m2 laboratory where the air purity is under strict supervision.


State-of-the-art equipment, including electron and scanning-tunneling microscopes, as well as other nanofabrication and characterization tools, are managed by specialists and used by researchers from a wide variety of fields.