X-ray reflectivity/diffractometry (X'pert PRO by PANalytical)
X-ray diffraction for enabling wide-ranging structural characterizations such as layer crystallinity, grain size analysis, epitaxial relations, layer thickness and interface intermixing, allowing for the optimization of sample preparation conditions and layering sequences.
What we can offer:
Layer crystalllinity and thickness analysis
Grain size analysis
Epitaxial relations and interface intermixing studies
Thin-film coatings characterization (thickness, density, interface roughness)
Crystallographic phase identification and crystal grain size measurements
Phase identification and quantification
Pore size distribution
Interesting for (with the system):
Material science industry, biotech, automotive industry, iron ad steel industry, metallurgy, machine tool manufacturers, microelectronics and microsystems industry.