High-resolution Transmission Electron Microscope (HRTEM)

High-resolution Transmission Electron Microscope photograph
Offered as External Service
Research group

What we can offer (with the system):

  • High resolution TEM/STEM imaging of crystalline or amorphous materials

  • Atomic structure of 2D materials

  • Structure of interfaces and grain boundaries, defects, nanoparticles

  • Nanostructural analysis of thin films, layers, multilayers and interfaces

  • Characterization of magnetic nanomaterials: thin films, nanowires, nanoparticles

  • Chemical elements local analysis or mapping; bonding state and valence state characterization

  • 3D characterization of materials by means of electron tomography

  • Cooling/Heating (-170C to 1200C) while imaging with TEM/STEM

Interesting for (with the system):

Material science, microelectronics and semiconductors, automotive, laboratory test facilities, microscopy laboratories, machine tool manufacturers, iron and steel industry, life science, objects of cultural heritage examination, energy and petrochemical companies

Technical characteristics
  • High tension: 60 kV – 300 kV
  • High-brightness XFEG gun
  • Point resolution 0.08 nm
  • Imaging side Cs corrector
  • Detectors: HAADF detector (Fishione), BF, ADF and HAADF detectors (Gatan)
  • Pre- and post- GIF 2 k x 2 k CCD ultrascan cameras (Gatan)
  • EDX RTEM (EDAX) detector for x-ray analysis
  • Lorentz lens
  • Biprism
  • Possibility to heat the sample in-situ (up to 1200 ºC)
External services type
External services title
High-resolution Transmission Electron Microscope (HRTEM)