Nanodevices - Journal - ACS Nano

1. S. Mahatha, J. Phillips, J. Corral-Sertal, D. Subires, A. Korshunov, A. Kar, J. Buck, F. Diekmann, G. Garbarino, Y. Ivanov, A. Chuvilin, D. Mondal, I. Vobornik, A. Bosak, K. Rossnagel, V. Pardo, A. Fumega and S. Blanco-Canosa
ACS Nano 18, 21052 (2024)
Self-Stacked 1T-1H Layers in 6R-NbSeTe and the Emergence of Charge and Magnetic Correlations Due to Ligand Disorder

2. Q. Wang, A. Bedoya-Pinto, M. Blei, A. Dismukes, A. Hamo, S. Jenkins, M. Koperski, Y. Liu, Q. Sun, E. Telford, H. Kim, M. Augustin, U. Vool, J. Yin, L. Li, A. Falin, C. Dean, F. Casanova, R. Evans, M. Chshiev, A. Mishchenko, C. Petrovic, R. He, L. Zhao, A. Tsen, B. Gerardot, M. Brotons-Gisbert, Z. Guguchia, X. Roy, S. Tongay, Z. Wang, M. Hasan, J. Wrachtrup, A. Yacoby, A. Fert, S. Parkin, K. Novoselov, P. Dai, L. Balicas and E. Santos
ACS Nano 16, 6960 (2022)
The Magnetic Genome of Two-Dimensional van der Waals Materials

3. A. Kovtun, A. Candini, A. Vianelli, A. Boschi, S. Dell'Elce, M. Gobbi, K. Kim, S. Avila, P. Samori, M. Affronte, A. Liscio and V. Palermo
ACS Nano 15, 2654 (2021)
Multiscale Charge Transport in van der Waals Thin Films: Reduced Graphene Oxide as a Case Study
PDF -Multiscale Charge Transport in van der Waals Thin Films: Reduced Graphene Oxide as a Case Study This document is the Accepted Manuscript version of a Published Work that appeared in final form in ACS Nano, copyright © American Chemical Society after peer review and technical editing by the publisher.

4. V. Caligiuri, G. Tedeschi, M. Palei, M. Miscuglio, B. Martin-Garcia, S. Guzman-Puyol, M. Hedayati, A. Kristensen, A. Athanassiou, R. Cingolani, V. Sorger, M. Salerno, F. Bonaccorso, R. Krahne and J. Heredia-Guerrero
ACS Nano 14, 9502 (2020)
Biodegradable and Insoluble Cellulose Photonic Crystals and Metasurfaces
PDF -Biodegradable and Insoluble Cellulose Photonic Crystals and Metasurfaces This document is the Accepted Manuscript version of a Published Work that appeared in final form in ACS Nano, copyright © American Chemical Society after peer review and technical editing by the publisher.

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