Skip to main content
en
es
eu
User account menu
Log in
Main Menu ES
nanoGUNE
At a Glance
Organization & Funding
People
Join us
Life
Newsroom
nanoPeople
Research
Research
Publications
Projects
External services
TechTransfer
TechTransfer
Start-ups
IP Portfolio
Industry collaborative research positions
Strategic lines
External services
News & events
Training
Master projects
Bachelor Final Projects
Summer Internships
Education University PHD
Society
User menu
Log in
Home
Equipment
View all
Characterization platform
Sample-fabrication platform
Direct Laser Writer
CRYO Plasma FIB
Plasma asher
Atomic-Force Microscope (AFM 5500 Agilent/Nano observer CSI Instruments)
FTIR Spectrometer PerkinElmer Frontier
Scattering-type near-field microscope (NeaSpec)
Reactive ion etcher (RIE Oxford Plasmalab 80 Plus)
High power industrial Picosecond Laser
Four point probe
Mask aligner (EVG)
Environmental Scanning-electron Microscope (eSEM-FEI Quanta 250)
High-resolution Transmission Electron Microscope (HRTEM)
X-ray reflectivity/diffractometry (X'pert PRO by PANalytical)
Quantum Design PPMS
UHV Sputtering System (AJA Int.)
Oerlikon - UNIVEX 350 / EPVD75 Kurt J. Lesker
ALD Cambridge Nanotech Savannah S100
Electron-Beam Lithography (Raith -150-TWO / E-line)
Dual-beam FIB/SEM - FEI Helios Nanolab / FEI Helios 450S
Atomic-Force Microscope (AFM 5500 Agilent/Nano observer CSI Instruments)
